Raman Mapping Of Graphene. Raman maps were obtained for two different graphene-integrated silicon MRR devices with radii of curvature r 10 μm and 20 μm. The reduction of GO is reflected by the upshift of the statistical distribution of the relative intensity ratio of the G and D peaks I DI.
The Raman mapping entails the coordinated measurement of Raman spectra with successive movements The results of a Raman map measurement using Thermo Scientific OMNIC Atlμs mapping software is shown in Figure 6. Analysis of the Raman G and 2D peak p. Exporting data from the Raman-XploRa.
The maps were obtained from a 120 120 point array with a step size between each point of 025 μm and the precise frequency intensity and width of the Raman G and 2D peaks were determined by fitting with Lorentzian line-shapes to the spectral peaks.
The twist angle between graphene layers adds another dimension to control its properties. Raman maps were obtained for two different graphene-integrated silicon MRR devices with radii of curvature r 10 μm and 20 μm. The determination of the layer number on each graphene flake was accomplished by the monitoring of the observed Raman shifts as a function of the position and confirmed via AFM measurements. The Raman Mapping of Graphene If an automated stage is integrated into the Raman microscope Raman maps or images can be obtained from the sample.
